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Electronic Component Testing

  • Textbook
  • © 1972
  • Latest edition

Overview

Editors:
  1. W. F. Waller
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Table of contents (10 chapters)

  1. Front Matter

    Pages i-iv
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  2. Resistors

    • S. Osborne
    Pages 1-8

  3. Capacitors

    • R. J. Everitt
    Pages 9-17

  4. Wound Components

    • N. A. Eaton, H. D. M. Overton
    Pages 18-25

  5. General Purpose Semiconductors

    • M. R. McCann
    Pages 26-33

  6. Power Semiconductors

    • R. D. Eveleigh
    Pages 34-42

  7. Microwave Semiconductors

    • A. Hale
    Pages 43-55

  8. Linear Integrated Circuits

    • A. R. Townsend
    Pages 56-62

  9. Digital Integrated Circuits

    • R. S. Whiskin
    Pages 63-70

  10. Electronic Tubes

    • D. L. Jones, B. G. Kennet
    Pages 71-82

  11. Relays and Switches

    • J. J. Langridge
    Pages 83-88

  12. Back Matter

    Pages 89-91
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Keywords

Bibliographic Information

  • Book Title: Electronic Component Testing

  • Editors: W. F. Waller

  • DOI: https://doi.org/10.1007/978-1-349-01586-3

  • Publisher: Red Globe Press London

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Macmillan Publishers Limited 1972

  • Edition Number: 1

  • Number of Pages: IV, 91

  • Additional Information: Previously published under the imprint Palgrave

  • Topics: Electronics and Microelectronics, Instrumentation

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